Magnetic Testing

Functional Material Measurement Systems

Instruments for measuring ferroelectric, piezoelectric, dielectric, insulation and vibration properties of functional and smart materials.

Ferroelectric Test System

Ferroelectric Test System

Ferroelectric material testing system for hysteresis loop, fatigue, imprint, C-V curve, leakage current and dielectric capacitance measurements.

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Laser Doppler Vibrometer

Laser Doppler Vibrometer

DXLV-03 fiber laser Doppler vibrometer combining advanced optical testing and digital signal processing for high-resolution, low-noise vibration measurement.

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Dielectric Charging and Discharging System

Dielectric Charging and Discharging System

Dielectric charge and discharge test system for studying high-voltage discharge performance of dielectric energy storage materials.

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Impedance Analyzer

Impedance Analyzer

Precision impedance analyzer for characterising complex impedance versus frequency in functional materials and electronic components.

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Electrical Properties Measurement System

Electrical Properties Measurement System

System for measuring ferroelectric, piezoelectric, pyroelectric, dielectric and insulation properties under controlled temperature environments.

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Insulation Resistance Tester

Insulation Resistance Tester

High-temperature insulation resistance tester using a parallel-plate method with improved anti-interference and measurement stability.

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Dielectric Measurement System

Dielectric Measurement System

Dielectric temperature spectrum measurement system for electrical testing of insulating materials across temperature and frequency ranges.

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LCR Multi-channel Test Device

LCR Multi-channel Test Device

Multi-channel LCR test device for simultaneous dielectric and resistance measurements in electronic component and sensor R&D.

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Piezoelectric Coefficient Tester

Piezoelectric Coefficient Tester

High-temperature piezoelectric coefficient tester using advanced weak-signal acquisition and FPGA digital technology for accurate measurements.

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Atomic Force Microscope

Atomic Force Microscope

Wafer-level atomic force microscope for 3D surface morphology characterisation of conductors, semiconductors and insulating materials.

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Thermal Stimulation Current Tester

Thermal Stimulation Current Tester

DX-TSC thermal stimulation current tester for studying dielectric relaxation time, phase transitions, glass transition temperature and activation energy.

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