Functional Material Measurement
Electrical Properties Measurement System
This Electrical Properties Measurement System is used for electrical testing of functional materials such as ferroelectricity, piezoelectricity, pyroelectricity, dielectricity and insulation resistance under high and low temperature environments.
Many adaptive interfaces have been developed with international electrical testing instruments in terms of communication protocols, database processing and software compatibility. This makes the instrument system easier to expand in the future in both software and hardware while saving time and cost during upgrades.
System Configuration Diagram
System Components
| Test System | Equipment | Description |
|---|---|---|
| Ferroelectric Analyzer | Ferroelectric parameter analyzer | 1. Ferroelectric parameter analyzer, high voltage amplifier, brake test fixture, system controller, test fixture, displacement sensor and high and low temperature environment combination can realize ferroelectric performance testing of functional materials, piezoelectric performance testing, pyroelectric performance testing, thermally stimulated polarization current tester (TSDC) and other functional tests. 2. High and low temperature environment can be equipped with hot and cold tables, high and low temperature test chambers or near-infrared high temperature furnaces. |
| Ferroelectric Analyzer | High voltage amplifier | Used with the ferroelectric analyzer to provide high voltage during testing. |
| Ferroelectric Analyzer | Various test fixtures | Different fixtures for various functional material testing conditions. |
| Ferroelectric Analyzer | High and low temperature environment chamber | Used to provide high and low temperature testing environments. |
| Dielectric temperature spectrum test | Impedance analyzer | Impedance analyzer with high and low temperature environment box, hot and cold stage or near-infrared high temperature furnace can realize dielectric temperature spectrum and spectrum measurement of materials. |
| Insulation resistance test | High resistance meter | High resistance meter with high and low temperature environment box, hot and cold stage or near infrared high temperature furnace can measure resistance, resistivity and resistance spectrum of materials at high and low temperature. |
| Low resistance test | Low resistance tester | Low resistance meter with high and low temperature environment box, hot and cold stage or near infrared high temperature furnace can measure resistance, resistivity and resistance spectrum of materials at high and low temperature. |
| Four-probe test | Source meter | Source meter with high and low temperature environment box, hot and cold stage or near infrared high temperature furnace can measure the conductive properties of semiconductor materials at high and low temperature. |
| Seebeck coefficient / resistance measurement system | Infrared high temperature furnace | Combination of source meter, infrared high temperature furnace and system controller can evaluate thermoelectric properties of metal or semiconductor materials. Seebeck coefficient and resistance can be measured with one instrument. |
| System controller | System controller | Temperature control of hot and cold stage or high and low temperature test box and near infrared reflection furnace. Responsible for acquisition of voltage, current, switching signals and displacement signals. |
| High voltage polarization power supply | Polarization power supply | Used for polarization, material breakdown and ceramic flash burning of piezoelectric ceramics and piezoelectric film materials. |
| Mechanical in-situ loading device | Loading device | Used for in-situ loading and parameter testing and analysis of piezoelectric ceramic materials. |
Extensible Test Device
Test Module
01 Ferroelectric Parameter Test Function
- Dynamic Hysteresis
- Static Hysteretic
- PUND
- Fatigue
- Retention
- Imprint
- Leakage current
- Thermo Measurement
02 Insulation Resistance Test Function
High precision voltage output and current measurement ensure accurate test results and are suitable for testing functional materials in high temperature environments.
Example materials:
- Ceramic materials
- Silicone rubber
- PCB
- Mica
- PTFE materials
It can also be used for high temperature insulation resistance testing of new materials in research laboratories.
03 Piezoelectric Parameter Test Function
This module can perform static d33 and other parameter tests on piezoelectric ceramics. Dynamic piezoelectric coefficients can also be measured using displacement sensors through high voltage discharge methods.
04 High Temperature Four-Probe Test Function
Used for electrical conductivity testing of functional material conductors and semiconductor materials in high temperature environments. The dual-position digital four-probe tester follows national standards for single crystal silicon testing and also references the ASTM standard.
05 Pyroelectric Test Function
Used for temperature-dependent pyroelectric performance testing of thin film and bulk materials.
Measured parameters:
- Pyroelectric current
- Pyroelectric coefficient
- Residual polarization intensity
Temperature range:
- Thin film materials: −196℃ to +600℃
- Bulk materials: RT to 200℃ / RT to 600℃ / RT to 800℃
06 Dielectric Temperature Spectrum Test Function
Used to analyze dielectric properties of materials including:
- Impedance Z
- Reactance X
- Admittance Y
- Conductance G
- Susceptance B
- Inductance L
- Dielectric loss D
- Quality factor Q
It can also analyze curves of materials with temperature, frequency, time and bias voltage and can perform Curie temperature testing of piezoelectric ceramics.
07 Seebeck Coefficient / Resistance Measurement System
Used for thermoelectric property analysis of semiconductor materials, ceramic materials and metal materials.
Optional configurations:
- Thin film measurement option
- Low temperature option (−100℃ to 200℃)
- High resistance option up to 10MΩ
08 Electrocaloric Effect Test Function
Used for testing electrocaloric performance of materials over a wide temperature range.
- Temperature range: −50℃ to 200℃
- Heat flow time range: 1s – 1000s
- Maximum voltage: 10kV
Supported waveforms:
- User-defined waveform
- Pulse waveform
- Triangle waveform
- Sine waveform
- Arbitrary waveform
- Predefined waveform
09 Thermally Stimulated Polarization Current Test (TSDC)
Used to study important physical mechanisms of functional materials such as molecular relaxation, phase transition and glass transition temperature. TSDC technology can also analyze relaxation time and activation energy of dielectric materials.
Test Module Image
