Functional Material Measurement

Ferroelectric Test System

The ferroelectric material testing system is mainly used for ferroelectric material hysteresis loop testing, fatigue testing, imprint testing, C-V curve testing, leakage current curve measurement, and dielectric material capacitance measurement.

Laser Doppler Vibrometer

The DXLV-03 Fiber Laser Doppler Vibrometer integrates advanced optical testing technology and digital signal processing technology. The equipment has strong anti-interference ability, high resolution and dynamic measurement range, and has been widely used in major universities, research institutes and high-tech enterprises. The equipment is easy and quick to install, and can easily obtain vibration data. It perfectly cooperates with ferroelectric analyzers for strain measurement.

Dielectric Charging and Discharging System

Dexinmag dielectric charge and discharge test system is mainly used to study the high voltage discharge performance of dielectric energy storage materials.

Impedance Analyzer

A precision impedance analyzer is an electronic test instrument that can measure the change of complex electrical impedance with frequency.

Electrical Properties Measurement System

This Electrical Properties Measurement System is used for electrical testing of functional materials such as ferroelectricity, piezoelectricity, pyroelectricity, dielectricity, insulation resistance, etc. in high and low temperature environments.

Insulation Resistance Tester

The high temperature insulation resistance tester uses the parallel plate method design principle to measure. Using a unique resistance test system, the anti-interference ability of the fixture is improved, the repeatability and stability are better, and the accuracy is greatly improved. It can be used for product testing and research on the electrical properties of new materials.

Dielectric Measurement System

The high and low temperature dielectric temperature spectrum measurement system is mainly used for electrical testing of insulating materials at different temperatures and frequencies.

LCR Multi-channel Test Device

The LCR Multi-channel Test Device can be used for multi-channel dielectric and resistance measurement, and the multichannel dielectric/resistance test module can also be applied to the research and development of electronic parts and sensors.

Piezoelectric Coefficient Tester

The design of the high-temperature piezoelectric coefficient tester is based on Dexinmag's advantages in weak signal acquisition technology and uses FPGA digital technology to provide a stable test frequency for the exciter, and cooperates with the exciter produced by B&K as the vibration source.

Atomic Force Microscope

The wafer-level atomic force microscope uses a micro-cantilever probe structure to characterize the three-dimensional appearance of solid materials such as conductors, semiconductors, and insulators, and can test large wafer-level samples.

Thermal Stimulation Current Tester

The DX-TSC thermal stimulation current tester can intuitively study the relaxation time, phase transition, glass transition temperature, activation energy and other related dielectric properties of materials. It is widely used in the fields of electricity, insulation, biomolecules and other materials.

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