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Hall Effect Measurement System

DX-70 Hall Measurement System is used to measure important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials. These parameters must be controlled in advance to understand the electrical properties of semiconductor materials. Therefore, the Hall effect test system is an important tool for understanding and researching semiconductor devices and the electrical properties of semiconductor materials.

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Hall Effect Measurement Equipment

DX-100 Hall Effect Measurement Equipment consists of an electromagnet, electromagnet power supply, high precision constant current source, high precision voltmeter, Hall effect sample holder, standard sample and system software.

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Hall Effect Device

DX-3000 Hall Effect Device is a fully automated test system, which integrates the Hall effect, magnetoresistance, and IV characteristics test in one machine.

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Permanent Magnet Hall Effect Meter

DX-30 Permanent Magnet Hall Effect Meter consists of a permanent magnet, a high-precision constant current source high-precision voltmeter, a Hall effect sample holder, a standard sample, a high-precision Gauss meter and system software.

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DX-60 Hall Effect Measurement Instrument is composed of an electromagnet, electromagnet power supply, high precision constant current source, high precision voltmeter, Hall effect sample holder, standard sample and system software.

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DX-50 Hall Effect Measurement System is a necessary tool for understanding and studying the electrical properties of semiconductor devices and semiconductor materials. 

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This instrument system consists of: electromagnet, electromagnet power supply, high-precision constant current source high-precision voltmeter, Gauss meter, Hall effect sample holder, standard sample, high and low temperature Dewar, temperature controller, and system software.

High and Low Temperature Hall Effect Test System
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High Temperature Hall Measurement Setup

DX-1000H High Temperature Hall Measurement Setup consists of an electromagnet, a vacuum pump, a high-temperature vacuum chamber, a Gauss meter, a constant current source, an electromagnet current source, a temperature controller, a computer and software.

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Low Temperature Hall Effect Test System

DX-1000L Low Temperature Hall Effect Test System consists of an electromagnet, electromagnet power supply, high-precision constant current source and high-precision voltmeter, Hall effect sample holder, standard sample, high and low temperature Dewar, temperature controller, and system software.

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The DX-9000 series electrical transport property measurement system is a fully automated test system that integrates Hall effect, magnetoresistance, variable temperature resistance, I-V characteristics and other tests.

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The DX-300 electromagnetic fully automatic Hall effect test system is used to measure important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials. The movable micro-probe station combined with a high-definition television microscope can test material parameters with very small electrodes according to customer needs.

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