Systems Private Limited
Hall Effect Measurement System
DX-1000L Low Temperature Hall Effect Test System is used to measure important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials. These parameters must be controlled in advance to understand the electrical properties of semiconductor materials. Therefore, the Hall effect test system is an important tool for understanding and researching semiconductor devices. and electrical properties of semiconductor materials.
The experimental results are automatically calculated by the software, and parameters such as Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient, and Magnetoresistance can be obtained at the same time.
The DX-320 effector specially developed for this instrument system integrates a constant current source, a six and a half microvolt meter and a complex switching relay-switch for Hall measurement, which greatly reduces the connection and operation of the experiment. DX-320 can be used as a constant current source and microvoltmeter alone.
Parameters of DX-30 Permanent Magnet Hall Effect Meter:
Parameters of each component:
High precision electromagnet:
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Pole diameter 100mm;
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The maximum magnetic field is 20000Gs when the air gap is 10mm;
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The maximum magnetic field is 13000 Gauss when the air gap is 20mm;
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The maximum magnetic field is 10000 gauss when the air gap is 30mm;
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Uniform area: when the spacing is 60mm, the diameter is 10mm, and the uniformity range is 1%;
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Weight 110 kg, including bracket and wheels.
High-precision bipolar constant current power supply
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Output: ±10A±80V;
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Power: 800W;
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The power supply output current can continuously change between positive and negative rated maximum current;
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The current can smoothly cross the zero point without switching commutation;
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Four-quadrant operation of output current and voltage (suitable for inductive loads);
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The current change rate can be set in the range of 0.0007~0.3 F.S./s (F.S. is the rated maximum output current);
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Current stability: better than ±25ppm/h (standard type); better than ±5ppm/h (high stability type);
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Current accuracy: ± (0.01% set value + 1mA)
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Current resolution: 20 bits, for example, 15A power supply, the current resolution is 0.03mA;
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Source effect: ≤ 2.0×10-5 F.S. (when the power supply voltage changes by 10%, the output current changes);
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Load effect: ≤ 2.0×10-5 F.S. (when the load changes by 10%, the output current changes);
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Current ripple (RMS): less than 1mA.
High precision gauss meter:
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Accuracy: ±0.30% of reading;
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Resolution: 0.01mT Range: 0-3T;
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Probe thickness: 1.0mm;
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Length: 100mm digital;
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Rs-232 interface data reading software with GP3 probe;
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All-aluminum non-magnetic bracket 5-70mm adjustable.
Constant current source and test table
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Constant current source range: ±50nA-±50mA;
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Resolution 0.1nA, continuously adjustable within the range;
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High-precision voltage data acquisition instrument range 0. 1uV-30V;
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Accuracy: 0.01%;
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Built-in test matrix conversion card;
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Ohmic contact kits Make kits based on ohmic contacts of different materials.
Cryostat:
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80K-293K high and low temperature vacuum container;
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DX301 thermostat temperature control (65k-600k);
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Vacuum pump K25 vacuum pump.