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Hall Effect Measurement System

DX-60 Hall device Instrument measures important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials. These parameters must be controlled in advance to understand the electrical characteristics of semiconductor materials. Therefore, the Hall effect test system is used to understand and study semiconductor devices. And tools necessary for the electrical properties of semiconductor materials.

 

The software and the bulk carrier concentration, surface carrier concentration, mobility, resistivity, Hall coefficient, magnetoresistance, etc, automatically calculate the experimental results.

 

The DX-320 effect meter specially developed for this instrument system assembles a constant current source, a six-and-a-half microvoltmeter and a Hall measuring complex switching relay-switch, which greatly reduces the connection and operation of the experiment. DX-320 can be used as a constant current source and a microvoltmeter alone

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Parameters of DX-60 Hall Effect Measurement Instrument:
Testable samples of the Hall device Instrument:
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