DX-70 Hall Measurement System

Name: DX-70 Hall Measurement System
Brand: MAGTRANS Systems

DX-70 Hall Measurement System is used to measure carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials. It is essential for researching semiconductor electrical properties and device behavior.

Product Overview

DX-70 Hall Effect Measurement System consists of:

Electromagnet
Electromagnet power supply
High-precision constant current source
High-precision voltmeter
Matrix card
Hall effect sample holder
Standard sample
System software

The system uses a KEITHLEY imported test source meter combined with a high-bandwidth matrix card to improve current supply range and Hall voltage accuracy.

Software automatically calculates:

Bulk Carrier Concentration
Sheet Carrier Concentration
Mobility
Resistivity
Hall Coefficient
Magnetoresistance

Technical Specifications

Physical parameters
	Carrier concentration	10³cm⁻³ - 10²³cm⁻³
	Mobility	0 .1 cm²/ voltsec - 10⁸cm²/ voltsec
	Resistivity range	10⁻⁷ Ohmcm - 10¹² Ohmcm
	Hall voltage	1 uV - 3V
	Hall coefficient	10⁻⁵ - 10²⁷cm³/ C
Testable material type
	Semiconductor material	SiGe, SiC, InAs, InGaAs, InP,AlGaAs, HgCdTe and ferrite materials etc.
	low resistance material	Graphene, metals, transparent oxides, weakly magnetic semiconductor materials, TMR materials, etc.
	high resistance material	Semi-insulating GaAs, GaN, CdTe, etc.
	Material Conductive Particles	Type P and Type N testing of materials
Magnetic field environment
	Magnet Type	Variable electromagnet
	Magnitude of magnetic field	1070mT (The pole pitch is 10mm) 687mT (The pole pitch is 20mm) 500mT (The pole pitch is 30mm) 378mT (The pole pitch is 40mm) 293mT (The pole pitch is 50mm)
	Uniform area	1%
	Optional magnetic environment	The electromagnet of relevant magnetic size can be customized according to the needs of customers
Electrical parameters
	Current source	±0.1nA- ±1000mA
	Current source resolution	0.001uA
	Measuring voltage	±10nV ~ ±200V
	Voltage measurement resolution	0.0001 mV
Other Accessories
	Shading	Extern ally installed light-shielding parts to make the test material more stable
	Sample size	Maximum 30mm * 30mm
	Box cabinet	6006001000mm
	Test piece	Hall effect of Institute of Semiconductors, Chinese Academy of Sciences Standard test samples and data: 1 set (Si, Ge, GaAs, lnSb)
	Making ohmic contacts	Electric soldering iron, indium chip, solder, enameled wire, etc.
	One-button automatic measurement	One-button automatic measurement can be performed without the need for human operation after the test is started
	I-V and BV curves	The software can perform I-V curve and BV curve
	Automatic temperature measurement	Set in software for automatic temperature measurement
	Data storage and export	The experimental results are measured, and the data will be temporarily saved in the software. If long-term storage is required, the data can be exported to an EXCEL table to facilitate later data processing.
	Standard samples and data	Provide the Hall effect standard test samples and data of the Institute of Semiconductors, Chinese Academy of Sciences: 1 set

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