DX-100 Hall Effect Measurement Equipment
DX-100 Hall Effect Measurement Equipment consists of an electromagnet, electromagnet power supply, high precision constant current source, high precision voltmeter, Hall effect sample holder, standard sample and system software.
It is used to measure carrier concentration, mobility, resistivity and Hall coefficient of semiconductor materials.
DX-320 System SourceMeter
The DX-320 effect meter integrates a constant current source and switching system into one unit, greatly reducing experimental wiring and improving efficiency. It can also operate independently as a constant current source and microvoltmeter.
Technical Specifications
| Physical parameters | ||
| Carrier concentration | 10³cm⁻³ - 10²³cm⁻³ | |
| Mobility | 0.1 cm²/V·sec - 10⁸cm²/V·sec | |
| Resistivity range | 10⁻⁷ Ohm·cm - 10¹² Ohm·cm | |
| Hall voltage | 1uV - 3V | |
| Hall coefficient | 10⁻⁵ - 10²⁷ cm³/C | |
| Magnetic field environment | ||
| Magnet type | Variable electromagnet | |
| Magnetic field magnitude | 1900mT (10mm pole pitch) 1300mT (20mm pole pitch) 900mT (30mm pole pitch) 800mT (40mm pole pitch) 600mT (50mm pole pitch) | |
| Uniform area | 1% | |
| Minimum resolution | 0.1Gs | |
| Electrical parameters | ||
| Current source | 50nA – 50mA | |
| Current resolution | 0.0001uA | |
| Measuring voltage | 0 ~ ±3V | |
| Voltage resolution | 0.0001 mV | |
| Other features | ||
| One-button automatic measurement | One-button automatic measurement | |
| I-V and BV curves | I-V and BV curve testing | |
| Automatic temperature measurement | Automatic temperature measurement | |
| Data export | Excel data export | |
| Standard samples | Standard test samples included | |
Testable Material Types
| Category | Description |
|---|---|
| Semiconductor material | SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe and ferrite materials etc. |
| Low resistance material | Graphene, metals, transparent oxides, weakly magnetic semiconductor materials, TMR materials, etc. |
| High resistance material | Semi-insulating GaAs, GaN, CdTe, etc. |
| Material Conductive Particles | Type P and Type N testing of materials |
Other Accessories
| Item | Specification |
|---|---|
| Shading | Externally installed light-shielding parts make the test material more stable. |
| Sample size | Normal: 10mm × 10mm; Maximum: 16mm × 16mm |
| Box cabinet | 600 × 600 × 1000 mm |
| Test piece | Hall effect standard test samples and data from Institute of Semiconductors, Chinese Academy of Sciences – 1 set (Si, Ge, GaAs, InSb) |
| Making ohmic contacts | Electric soldering iron, indium chip, solder, enameled wire, etc. |
High & Low Temperature Models
| Model | Temperature Range | Key Features |
|---|---|---|
| DX-100 | 80K ~ 500K | Resolution 0.1GS |
| DX-100H | 300K ~ 500K | High temperature |
| DX-100L | 80K ~ 300K | Low temperature |
| DX-200L | 4K ~ 300K | Ultra low temperature |
| DX-500 | 80K ~ 800K | Extended range |
| DX-500H | 300K ~ 800K | High temperature extended |
DX-100 High and Low Temperature Hall Effect Test System
| Parameter | Specification |
|---|---|
| Temperature range | 80K ~ 500K (temperature adjustment 0.1K) |
| Minimum resolution | 0.1GS |
| Sample current | 0.05uA – 50mA (adjust 0.1nA) |
| Magnetic field | 2T at 10mm spacing; 1T at 30mm spacing |
| Resistivity range | 10⁻⁵ – 10⁷ Ohm·cm |
| Carrier concentration | 10³ – 10²³ cm⁻³ |
| Mobility | 0.1 – 10⁸ cm²/V·sec |
| Resistance range | 10mΩ – 6MΩ |
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