Hall Effect Measurement System
DX-60 Hall Effect Measurement Instrument
Electromagnet-based Hall effect instrument for precise measurement of carrier concentration, mobility, resistivity and Hall coefficient in semiconductor and functional materials.
The DX-60 Hall effect measurement instrument provides a controlled magnetic field environment and integrated electrical measurement chain for characterising semiconductor samples. By combining a variable electromagnet with precision current and voltage sourcing, the system enables accurate determination of carrier concentration, Hall mobility, resistivity and Hall coefficient.
With automated calculation of transport parameters and support for I–V and BV curve measurements, the DX-60 is well suited for university laboratories, research institutes and industrial R&D teams studying the electrical properties of semiconductor and low-dimensional materials.
Key Features
- Variable electromagnet providing up to 1200 mT at 10 mm pole pitch.
- High-precision current and voltage measurement for stable Hall and resistivity data.
- Wide carrier concentration measurement range from 10³ cm⁻³ to 10²³ cm⁻³.
- Resistivity range from 10⁻⁷ Ω·cm to 10¹² Ω·cm.
- Software-driven calculation of Hall and magnetoresistance parameters.
- I–V and BV curve measurement capability.
- One-button automatic measurement after conditions are configured.
- Measurement results exportable to Excel for further processing.
Technical Specifications
| Specification | Value |
|---|---|
| Measurement Parameters | |
| Carrier concentration | 10³ cm⁻³ – 10²³ cm⁻³ |
| Mobility | 0.1 cm²/V·s – 10⁸ cm²/V·s |
| Resistivity range | 10⁻⁷ Ω·cm – 10¹² Ω·cm |
| Hall voltage | 1 µV – 3 V |
| Hall coefficient | 10⁻⁵ – 10²⁷ cm³/C |
| Magnetic System | |
| Magnet type | Variable electromagnet |
| Magnetic field strength | 1200 mT @ 10 mm, 750 mT @ 20 mm, 520 mT @ 30 mm |
| Field uniformity | ≈ 1% over defined area |
| Electrical System | |
| Current source range | 50 nA – 50 mA |
| Current source resolution | 0.0001 µA |
| Voltage range | 0 – ±3 V |
| Voltage measurement resolution | 0.0001 mV |
| Physical / Mechanical | |
| Sample size | Up to 10 mm × 10 mm |
| Cabinet dimensions | Approx. 600 × 600 × 1000 mm |
Applications
- Semiconductor materials for transport-property characterisation.
- Low resistance materials such as metals and conductive oxides.
- High resistance materials including semi-insulating compounds.
- P-type and N-type materials for conductivity type verification.
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