Hall Effect Measurement System
DX-30 Permanent Magnet Hall Effect Meter
Compact permanent-magnet Hall effect meter for characterising carrier concentration, mobility, resistivity and Hall coefficient in research and teaching laboratories.
The DX-30 permanent magnet Hall effect meter is designed for routine characterisation of semiconductor and functional materials. It provides a stable 500 mT magnetic field together with integrated current and voltage measurement, enabling accurate extraction of carrier concentration, Hall mobility, resistivity and Hall coefficient from standard Hall bar or van der Pauw samples.
With automated measurement software and a compact cabinet, the system is well suited to university teaching laboratories, research institutes and industrial R&D groups that require reliable Hall effect measurements without the complexity of a large electromagnet installation.
Key Features
- Permanent magnet field system with nominal 500 mT field strength.
- High-precision current and voltage measurement for stable Hall data.
- Wide carrier concentration measurement range from 10³ cm⁻³ to 10²³ cm⁻³.
- Wide resistivity and mobility range for low- and high-resistance materials.
- Automatic software calculation of Hall and resistivity parameters.
- I–V and BV curve measurement capability.
- One-button automated measurement after test conditions are configured.
- Measurement results exportable to Excel for further analysis.
Technical Specifications
| Specification | Value |
|---|---|
| Measurement Parameters | |
| Carrier concentration | 10³ cm⁻³ – 10²³ cm⁻³ |
| Mobility | 0.1 cm²/V·s – 10⁸ cm²/V·s |
| Resistivity range | 10⁻⁵ Ω·cm – 10⁷ Ω·cm |
| Hall voltage | 1 µV – 3 V |
| Hall coefficient | 10⁻⁵ – 10²⁷ cm³/C |
| Magnetic System | |
| Magnet type | NMR series permanent magnet |
| Magnetic field strength | 500 mT (nominal) |
| Pole spacing | 18 mm |
| Electrical System | |
| Current source range | 50 nA – 50 mA |
| Current source resolution | 0.0001 µA |
| Voltage range | 0 – ±3 V |
| Voltage measurement resolution | 0.0001 mV |
| Physical / Mechanical | |
| Sample size | Up to 30 mm × 30 mm |
| Cabinet dimensions | Approx. 600 × 600 × 1000 mm |
Applications
- Semiconductor materials for transport-property characterisation.
- Low resistance materials such as metals and conductive oxides.
- High resistance materials including semi-insulating compounds.
- P-type and N-type materials for conductivity type verification.
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