Magnetic Testing

DX-2012M Silicon Steel Material Automatic Measuring Device

Soft Magnetic Materials Measurement

Automatic AC magnetic property measuring system for silicon steel materials, supporting standard Epstein square coils and core testing from 40 Hz to 1 kHz.

DX-2012M Silicon Steel Material Automatic Measuring Device

Product Overview

DX-2012M Silicon Steel Material Automatic Measuring Device is designed for automatic measurement of AC magnetic properties of silicon steel materials.

The system is widely used for incoming inspection and quality control of hot-rolled and cold-rolled oriented and non-oriented silicon steel sheets.

DX-2012M supports testing using standard Epstein square coils and complies with international magnetic testing standards. The system can also directly measure AC magnetic properties of soft magnetic cores within the frequency range of 40 Hz – 1 kHz.

Measurement Accuracy and Repeatability

The following accuracy values are referenced using a standard Epstein square coil sample at 50 Hz frequency.

ParameterUncertainty (%)Repeatability (%)
Specific Total Loss (Ps)1.0±0.5
Magnetic Induction (Bm)0.5±0.3
Magnetic Field Strength (Hm)0.5±0.3
Amplitude Permeability (µa)1.0±0.5
Loss Angle (δ)2.0±1.0

Hardware Technical Parameters

Built-in Testing Power Supply

ParameterSpecification
Input Voltage220V ±20V / 10A
Input Power500VA sine wave
Frequency Range40Hz – 1000Hz
Frequency Error±0.05%
Output Voltage0–10–50–100–200V
Output Current0–20–20–10A
Voltage Distortion<0.5%
Voltage Stability<0.2%
Signal GenerationDDS digital frequency synthesis

System Parameters

ParameterSpecification
Processor32-bit ARM embedded processor
InterfaceRS232 communication
PC ControlSupports upper computer software control

Sampling Technology

ParameterSpecification
A/D Converter16-bit dual channel
Sampling SpeedUp to 1MHz
Sampling MethodAutomatic value replacement

Measurement Accuracy

Measurement conditions:

  • Preheated for 10 minutes
  • Temperature: 23 ±5°C
  • Humidity: 30–75% RH
  • No external magnetic field interference
ParameterAccuracy
Magnetic Induction Locking±0.5%
Magnetic Field Locking±0.5%
Magnetic Induction Measurement±(0.2% + correction factor)
Magnetic Field Measurement±(0.2% + correction factor)

Specific total loss measurement accuracy depends on the phase angle between induced voltage and excitation current.

Software Functions

The DX-2012M software provides automatic measurement, analysis and report generation.

  • Automatic test control and data saving through PC connection
  • Sorting and classification of key parameters (Br, Bm, Hc, Hm, Ps, µa)
  • Accurate measurement of voltage, current, frequency and power parameters
  • Measurement of dynamic magnetic parameters including permeability and loss angle
  • Generation of waveform reports including I-V-B waveforms and B-H hysteresis loops
  • Display of magnetization curves and permeability curves
  • Loss curve analysis Ps-B curve
  • Multi-curve comparison of different samples or frequencies
  • Supports Chinese and English interface with automatic report generation

Applications

  • Silicon steel sheet production quality control
  • Transformer core material testing
  • Electrical steel research laboratories
  • Magnetic material development
  • University research and academic laboratories

Ready to evaluate this system?

Talk with our engineering team about your measurement requirements, integration constraints and delivery timelines.